TSM BPA - Honorable Mention by Gangmin Cho and Professor Shin


The paper authored by Gangmin Cho, Yonghwi Kwon, Pervaiz Kareem, and Youngsoo Shin, entitled “Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling”, has been recognized with an Honorable Mention in the TSM 2022 Best Paper Award by the Editorial Board of IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING.